Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
Language
en
Article de revue
This item was published in
Superlattices and Microstructures. 2005-07-06, vol. 38, n° 1, p. 69-75
Elsevier
English Abstract
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 mu s. This value ...Read more >
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 mu s. This value confirms the value found in the literature. Measurements also allow us to determine the total thermal tip-sample contact resistance Z(Th)(C)Read less <
English Keywords
SThM technique
microcooler
Wollaston wire
SThM thermal probe time response
Tip-sample contact resistance
SThM technique
Origin
Hal imported