Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
Idioma
en
Article de revue
Este ítem está publicado en
Superlattices and Microstructures. 2005-07-06, vol. 38, n° 1, p. 69-75
Elsevier
Resumen en inglés
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 mu s. This value ...Leer más >
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 mu s. This value confirms the value found in the literature. Measurements also allow us to determine the total thermal tip-sample contact resistance Z(Th)(C)< Leer menos
Palabras clave en inglés
SThM technique
microcooler
Wollaston wire
SThM thermal probe time response
Tip-sample contact resistance
SThM technique
Orígen
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