BiCMOS thermal sensor circuit for built-in test purposes
Language
en
Article de revue
This item was published in
Electronics Letters. 1998-01-25, vol. 34, n° 13, p. 1307-1309
IET
English Abstract
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present ...Read more >
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present a new built-in IC-surface differential thermal sensor. The sensor, analysis, implementation on a BiCMOS specific integrated circuit, and experimental measurements show the viability of temperature sensing for testing purposes.Read less <
Origin
Hal imported