BiCMOS thermal sensor circuit for built-in test purposes
Idioma
en
Article de revue
Este ítem está publicado en
Electronics Letters. 1998-01-25, vol. 34, n° 13, p. 1307-1309
IET
Resumen en inglés
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present ...Leer más >
New difficulties have arisen in integrated circuit (IC) testing due to trends in technological development. Alternatives to traditional circuit testing techniques are appearing, such as thermal testing. The authors present a new built-in IC-surface differential thermal sensor. The sensor, analysis, implementation on a BiCMOS specific integrated circuit, and experimental measurements show the viability of temperature sensing for testing purposes.< Leer menos
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Importado de HalCentros de investigación