Oxygen isotopic exchange: A useful tool for characterizing oxygen conducting oxides
FOULETIER, Jacques
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
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Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
FOULETIER, Jacques
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
< Reduce
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Language
en
Article de revue
This item was published in
Applied Catalysis A : General. 2005, vol. 289, n° 1, p. 84-89
Elsevier
English Abstract
The 18O/16O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful ...Read more >
The 18O/16O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful tool since we obtain in both cases data concerning the oxygen diffusion in the bulk and the oxygen exchange at the surface of the materials. Comparisons were done, including results concerning the role of the surface with regards to the oxygen reduction reaction. Detailed experimental and analytical processes are given.Read less <
English Keywords
SOFC
Mixed conducting oxides
Oxygen transport properties
Oxygen reduction
Origin
Hal imported