Oxygen isotopic exchange: A useful tool for characterizing oxygen conducting oxides
FOULETIER, Jacques
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Leer más >
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
FOULETIER, Jacques
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
< Leer menos
Laboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
Idioma
en
Article de revue
Este ítem está publicado en
Applied Catalysis A : General. 2005, vol. 289, n° 1, p. 84-89
Elsevier
Resumen en inglés
The 18O/16O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful ...Leer más >
The 18O/16O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful tool since we obtain in both cases data concerning the oxygen diffusion in the bulk and the oxygen exchange at the surface of the materials. Comparisons were done, including results concerning the role of the surface with regards to the oxygen reduction reaction. Detailed experimental and analytical processes are given.< Leer menos
Palabras clave en inglés
SOFC
Mixed conducting oxides
Oxygen transport properties
Oxygen reduction
Orígen
Importado de HalCentros de investigación