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hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorBASSAT, Jean-Marc.
hal.structure.identifierLaboratoire de Recherche sur la Réactivité des Solides [LRRS]
dc.contributor.authorPETITJEAN, P.
hal.structure.identifierLaboratoire d'Electrochimie et de Physico-chimie des Matériaux et des Interfaces [LEPMI ]
dc.contributor.authorFOULETIER, Jacques
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorLALANNE, Cécile
hal.structure.identifierLaboratoire de Recherche sur la Réactivité des Solides [LRRS]
dc.contributor.authorCABOCHE, C.
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorMAUVY, Fabrice
hal.structure.identifierInstitut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
dc.contributor.authorGRENIER, Jean-Claude
dc.date.issued2005
dc.identifier.issn0926-860X
dc.description.abstractEnThe 18O/16O isotope exchange depth profile technique (IEDP) followed by SIMS characterizations was applied to dense membranes of pure ionic conductors and mixed ionic/electronic conducting materials. It is a very useful tool since we obtain in both cases data concerning the oxygen diffusion in the bulk and the oxygen exchange at the surface of the materials. Comparisons were done, including results concerning the role of the surface with regards to the oxygen reduction reaction. Detailed experimental and analytical processes are given.
dc.language.isoen
dc.publisherElsevier
dc.subject.enSOFC
dc.subject.enMixed conducting oxides
dc.subject.enOxygen transport properties
dc.subject.enOxygen reduction
dc.title.enOxygen isotopic exchange: A useful tool for characterizing oxygen conducting oxides
dc.typeArticle de revue
dc.identifier.doi10.1016/j.apcata.2005.04.054
dc.subject.halChimie/Matériaux
bordeaux.journalApplied Catalysis A : General
bordeaux.page84-89
bordeaux.volume289
bordeaux.issue1
bordeaux.peerReviewedoui
hal.identifierhal-00015495
hal.version1
hal.popularnon
hal.audienceInternationale
hal.origin.linkhttps://hal.archives-ouvertes.fr//hal-00015495v1
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