Relationship between pro le length and roughness variables for natural surfaces
Idioma
en
Article de revue
Este ítem está publicado en
International Journal of Remote Sensing. 2000-05-02, vol. 21, n° 17, p. 3375-3381
Taylor & Francis
Resumen en inglés
Surface roughness variables such as the rms height and the correlation length are commonly used as inputs for electromagnetic models to predict the backscattering coe cient. The objective of this study is to investigate ...Leer más >