Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
Langue
en
Article de revue
Ce document a été publié dans
Superlattices and Microstructures. 2005-07-06, vol. 38, n° 1, p. 69-75
Elsevier
Résumé en anglais
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 mu s. This value ...Lire la suite >
We present a simple method for the characterization of the dynamical behavior of the SThM Wollaston wire thermal resistive probe using Si/SiGe microcoolers. Measurements show a time response of about 186 mu s. This value confirms the value found in the literature. Measurements also allow us to determine the total thermal tip-sample contact resistance Z(Th)(C)< Réduire
Mots clés en anglais
SThM technique
microcooler
Wollaston wire
SThM thermal probe time response
Tip-sample contact resistance
SThM technique
Origine
Importé de halUnités de recherche