Double beam FT-IR reflection spectroscopy on monolayers
PÉRÉ, Eve
Laboratoire de Physico-Chimie Moléculaire [LPCM]
Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]
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Laboratoire de Physico-Chimie Moléculaire [LPCM]
Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]
Language
en
Communication dans un congrès
This item was published in
1995-08-27, Budapest. 1995p. 627-629
Springer-Verlag Wien
English Abstract
For in situ infrared studies of ultrathin films deposited on solid substrates or spread at an air/liquid interface, we have developed a new FT-IR double beam approach basedondifferential reflectivity by polarization ...Read more >
For in situ infrared studies of ultrathin films deposited on solid substrates or spread at an air/liquid interface, we have developed a new FT-IR double beam approach basedondifferential reflectivity by polarization modulation. Beca use only the s-component (perpendicula r to the plane of incidence) of th e electromagnetic tield is inciden t o n the studied surface. the spectral fea tures a reeasy to interpret in terms of molccular orientation. Spectra of a cadmium a rachidate La ngmuir- Blodgett film deposited on a goldmirrar and a DMPC Langmuir film spread at the air/water interfaceRead less <
English Keywords
d o uble beam FT-IR. rellection spectroscopy. differential reflectivity
pola rization modulation
Origin
Hal imported