BUFFETEAU, T.; DESBAT, B.; PÉRÉ, Eve; TURLET, J. M.

Metadatos

Licencia de uso del documento

BUFFETEAU, T.
Laboratoire de Physico-Chimie Moléculaire [LPCM]

DESBAT, B.
Laboratoire de Physico-Chimie Moléculaire [LPCM]

PÉRÉ, Eve
Laboratoire de Physico-Chimie Moléculaire [LPCM]
Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux [IPREM]

Idioma

Communication dans un congrès

Este ítem está publicado en

1995-08-27, Budapest. 1995p. 627-629

Springer-Verlag Wien

Resumen en inglés

For in situ infrared studies of ultrathin films deposited on solid substrates or spread at an air/liquid interface, we have developed a new FT-IR double beam approach basedondifferential reflectivity by polarization modulation. Beca use only the s-component (perpendicula r to the plane of incidence) of th e electromagnetic tield is inciden t o n the studied surface. the spectral fea tures a reeasy to interpret in terms of molccular orientation. Spectra of a cadmium a rachidate La ngmuir- Blodgett film deposited on a goldmirrar and a DMPC Langmuir film spread at the air/water interface< Leer menos

Palabras clave en inglés

d o uble beam FT-IR. rellection spectroscopy. differential reflectivity

pola rization modulation

Orígen

Importado de Hal

Centros de investigación

Laboratoire Ondes et Matière d'Aquitaine (LOMA) - UMR 5798