Thermoreflectance measurements of transient temperature upon integrated circuits: application to thermal conductivity identification
Langue
en
Article de revue
Ce document a été publié dans
Microelectronics Reliability. 1998-04, vol. 29, n° 4-5, p. 181-190
Elsevier
Résumé en anglais
An analytical 2D study, based on the method of integral transform, for transient heat transfer in a multilayered structure, and an optical technique for transient temperature measurement have been developed. Their application ...Lire la suite >