Thermoreflectance measurements of transient temperature upon integrated circuits: application to thermal conductivity identification
Idioma
en
Article de revue
Este ítem está publicado en
Microelectronics Reliability. 1998-04, vol. 29, n° 4-5, p. 181-190
Elsevier
Resumen en inglés
An analytical 2D study, based on the method of integral transform, for transient heat transfer in a multilayered structure, and an optical technique for transient temperature measurement have been developed. Their application ...Leer más >