Laser diode COFD analysis by thermoreflectance microscopy
Language
en
Article de revue
This item was published in
Microelectronics Reliability. 2001-09, vol. 41, n° 9-10, p. 1597-1601
Elsevier
English Abstract
We present thermoreflectance measurements upon a 980 nm wavelength laser diode. Using the energy conservation law, we are able to determine the temperature increase near the active region due to surface absorption. In this ...Read more >
We present thermoreflectance measurements upon a 980 nm wavelength laser diode. Using the energy conservation law, we are able to determine the temperature increase near the active region due to surface absorption. In this paper, we have studied the influence of this surface source contribution for three different configurations of the input current: below the threshold current ITh, for a moderate current above ITh and finally for a current far above ITh. We can analyse frome these reliability issues for the diode in terms of carastrophic optical facet damage (COFD)Read less <
Origin
Hal imported