Laser diode COFD analysis by thermoreflectance microscopy
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, S. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | GRAUBY, Stéphane | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | JOREZ, S. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | LOPEZ, L. D. P. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | SCHAUB, E. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLAEYS, W. | |
| dc.date.issued | 2001-09 | |
| dc.identifier.issn | 0026-2714 | |
| dc.description.abstractEn | We present thermoreflectance measurements upon a 980 nm wavelength laser diode. Using the energy conservation law, we are able to determine the temperature increase near the active region due to surface absorption. In this paper, we have studied the influence of this surface source contribution for three different configurations of the input current: below the threshold current ITh, for a moderate current above ITh and finally for a current far above ITh. We can analyse frome these reliability issues for the diode in terms of carastrophic optical facet damage (COFD) | |
| dc.language.iso | en | |
| dc.publisher | Elsevier | |
| dc.title.en | Laser diode COFD analysis by thermoreflectance microscopy | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1016/S0026-2714(01)00196-2 | |
| dc.subject.hal | Physique [physics] | |
| bordeaux.journal | Microelectronics Reliability | |
| bordeaux.page | 1597-1601 | |
| bordeaux.volume | 41 | |
| bordeaux.issue | 9-10 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-01550687 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01550687v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Microelectronics%20Reliability&rft.date=2001-09&rft.volume=41&rft.issue=9-10&rft.spage=1597-1601&rft.epage=1597-1601&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=DILHAIRE,%20S.&GRAUBY,%20St%C3%A9phane&JOREZ,%20S.&LOPEZ,%20L.%20D.%20P.&SCHAUB,%20E.&rft.genre=article |
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