Lead-free relaxor thin films of tungsten bronze symmetry
Language
en
Article de revue
This item was published in
Journal of Physics D: Applied Physics. 2009, vol. 42, n° 7, p. 075407 (7 p.)
IOP Publishing
English Abstract
We have processed Ba<sub>1+<i>x</i>/2</sub>LaNb<sub>5-<i>x</i></sub>Ti<sub><i>x</i></sub>O<sub>15</sub> thin films using radio-frequency magnetron sputtering. Using XRD, SEM, x-ray microprobe and RBS, the polycrystalline ...Read more >
We have processed Ba<sub>1+<i>x</i>/2</sub>LaNb<sub>5-<i>x</i></sub>Ti<sub><i>x</i></sub>O<sub>15</sub> thin films using radio-frequency magnetron sputtering. Using XRD, SEM, x-ray microprobe and RBS, the polycrystalline films have been optimized as to reach the nominal composition. Dielectric experiments have been performed on ceramics and thin films for frequencies between 100 Hz and 5 MHz in the temperature range 100-420 K. In the most stoichiometric films, relaxor behaviour is evidenced whose features are similar to those of ceramics of the same composition. Such an agreement between ceramics and thin films relaxors is only rarely reported in lead-free materials. Moreover, the relaxor state was reported in perovskite films and our present report broadens the range of structures in which it can occur.Read less <
English Keywords
Deposition by sputtering
X-ray diffraction
Permittivity (dielectric function)
Dielectric loss and relaxation
Dielectric thin films
Scanning electron microscopy
Origin
Hal imported