MICHAU, Dominique; SIMON, Annie; MAGLIONE, Mario

doi:10.1088/0022-3727/42/7/075407

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MICHAU, Dominique
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

SIMON, Annie
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

MAGLIONE, Mario
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]

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Journal of Physics D: Applied Physics. 2009, vol. 42, n° 7, p. 075407 (7 p.)

IOP Publishing

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We have processed Ba1+x/2LaNb5-xTixO15 thin films using radio-frequency magnetron sputtering. Using XRD, SEM, x-ray microprobe and RBS, the polycrystalline films have been optimized as to reach the nominal composition. Dielectric experiments have been performed on ceramics and thin films for frequencies between 100 Hz and 5 MHz in the temperature range 100-420 K. In the most stoichiometric films, relaxor behaviour is evidenced whose features are similar to those of ceramics of the same composition. Such an agreement between ceramics and thin films relaxors is only rarely reported in lead-free materials. Moreover, the relaxor state was reported in perovskite films and our present report broadens the range of structures in which it can occur.< Réduire

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Deposition by sputtering

X-ray diffraction

Permittivity (dielectric function)

Dielectric loss and relaxation

Dielectric thin films

Scanning electron microscopy

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Lead-free relaxor thin films of tungsten bronze symmetry

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