Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength
Language
en
Article de revue
This item was published in
Optical Materials Express. 2014, vol. 4, n° 1, p. 57-62
OSA pub
English Abstract
We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 ...Read more >
We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO5Read less <
English Keywords
Crystals
Measurements
Dielectrics
Origin
Hal imported