Direct measurement of the dielectric frame rotation of monoclinic crystals as a function of the wavelength
Idioma
en
Article de revue
Este ítem está publicado en
Optical Materials Express. 2014, vol. 4, n° 1, p. 57-62
OSA pub
Resumen en inglés
We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 ...Leer más >
We report a method based on Malus' law to directly measure the dielectric frame orientation of monoclinic crystals with an accuracy of 0.3°. This technique was validated by the study of Nd3+:YCa4O(BO3)3, Sn2P2S6, BiB3O6 and Eu3+:Y2SiO5< Leer menos
Palabras clave en inglés
Crystals
Measurements
Dielectrics
Orígen
Importado de HalCentros de investigación