Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI
Idioma
en
Article de revue
Este ítem está publicado en
IEEE Transactions on Nuclear Science. 2005p. PG1-1-PG1-5
Institute of Electrical and Electronics Engineers
Resumen en inglés
Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence ...Leer más >
Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence measurements are reported and discussed in the frame of comparisons between Synopsys code simulations and experimental results.< Leer menos
Orígen
Importado de HalCentros de investigación