Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI
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en
Article de revue
Ce document a été publié dans
IEEE Transactions on Nuclear Science. 2005p. PG1-1-PG1-5
Institute of Electrical and Electronics Engineers
Résumé en anglais
Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence ...Lire la suite >
Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence measurements are reported and discussed in the frame of comparisons between Synopsys code simulations and experimental results.< Réduire
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