Charge Collection Measurements on SOI Capacitors using Heavy Ion Microprobe at GSI
Language
en
Article de revue
This item was published in
IEEE Transactions on Nuclear Science. 2005p. PG1-1-PG1-5
Institute of Electrical and Electronics Engineers
English Abstract
Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence ...Read more >
Quantitative charge collection measurements have been performed on SOI capacitors using a58N33+ micro beam at 3.6 MeV/u. Collection efficiencies as well as charge sharing effects on adjacent devices through coincidence measurements are reported and discussed in the frame of comparisons between Synopsys code simulations and experimental results.Read less <
Origin
Hal imported