Listar Laboratoire Ondes et Matière d'Aquitaine (LOMA) - UMR 5798 por autor "RAMPNOUX, Jean-Michel"
Mostrando ítems 1-20 de 45
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Joule expansion imaging techniques on microlectronic devices
GRAUBY, Stéphane; PATINO LOPEZ, Luis-David; SALHI, Amine ...(Microelectronics Journal. vol. 40, n° 9, pp. 1367-1372, 2009-09)Article de revue -
Influence of Generated Defects by Ar Implantation on the Thermoelectric Properties of ScN
BURCEA, Razvan; BARBOT, Jean-François; RENAULT, Pierre-Olivier ...(ACS Applied Energy Materials. vol. 5, n° 9, pp. 11025-11033, 2022-09-26)Article de revue -
Frequency-Dependent Thermal Conductivity in Time Domain Thermoreflectance Analysis of Thin Films
PERNOT, Gilles; MICHEL, Hélène; VERMEERSCH, Bjorn ...Communication dans un congrès -
Determination of Thermophysical Properties of Si/SiGe Superlattices with a Pump-Probe Technique
EZZAHRI, Y.; GRAUBY, Stéphane; DILHAIRE, S. ...Communication dans un congrès -
Scanning thermal microscopy of individual silicon nanowires
PUYOO, Etienne; GRAUBY, Stéphane; RAMPNOUX, Jean-Michel ...(Journal of Applied Physics. vol. 109, n° 2, pp. 024302 (9), 2011-01-15)Article de revue -
Thermal exchange radius measurement: Application to nanowire thermal imaging
PUYOO, Etienne; GRAUBY, Stéphane; RAMPNOUX, Jean-Michel ...(Review of Scientific Instruments. vol. 81, n° 7, pp. 073701 (1-5), 2010-07-02)Article de revue -
Heavy-oxide glasses with superior mechanical assets for nonlinear fiber applications in the mid-infrared
STRUTYNSKI, Clément; CALZAVARA, Florian; GUERINEAU, Théo ...(Optical Materials Express. vol. 11, n° 5, pp. 1420-1430, 2021)Article de revue -
Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers
PERNOT, Gilles; STOFFEL, M.; SAVIC, I. ...(Nature Materials. vol. 9, n° 6, pp. 491-495, 2010)Article de revue -
Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy
GRAUBY, Stéphane; PUYOO, Etienne; RAMPNOUX, Jean-Michel ...(Journal of Physical Chemistry C. vol. 117, n° 17, pp. 9025-9034, 2013)Article de revue -
Femtosecond heterodyne pump probe platform
DODANE, Guillaume; EUPHRASIE, Sébastien; TEYSSIEUX, Damien ...(2014 European Frequency and Time Forum (EFTF), CH, Neuchatel, 2014-01-01)Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Experimental measurement of heat transport property: Why is heat transportmodelling required for nanometrology?
GOMÉS, Séverine; DILHAIRE, Stephan; BOURGEOIS, Olivier ...Communication dans un congrès -
Why is heat transport modelling required for nanometrology?
GOMÉS, Séverine; DILHAIRE, Stéfan; FLEURENCE, Nolwenn ...Communication dans un congrès -
Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology
DILHAIRE, Stefan; PERNOT, Gilles; CALBRIS, Gaëtan ...(Journal of Applied Physics. vol. 110, n° 11, pp. 114314 (1-13), 2011-12-08)Article de revue -
Study of thermomechanical properties of Si/SiGe superlattices using femtosecond transient thermoreflectance technique
EZZAHRI, Y.; DILHAIRE, S.; GRAUBY, Stéphane ...(Applied Physics Letters. vol. 87, n° 10, pp. 103506 (1-3), 2005-09-05)Article de revue -
Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement
PATINO-LOPEZ, L. D.; SALHI, M. A.; DILHAIRE, S. ...(Superlattices and Microstructures. vol. 35, n° 3-6, pp. 375-387, 2004-03)Article de revue -
Surface displacement imaging by interferometry with a light emitting diode
DILHAIRE, S.; GRAUBY, Stéphane; JOREZ, S. ...(Applied optics. vol. 41, n° 24, pp. 4996-5001, 2002-08-20)Article de revue -
Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR)
ZENJI, A.; RAMPNOUX, Jean-Michel; GRAUBY, S. ...(Journal of Applied Physics. vol. 128, n° 6, pp. 065106, 2020-08-14)Article de revue -
Fast Laser Scanning Imaging System for Surface Displacement Measurements
GRAUBY, Stéphane; SALHI, Amine; RAMPNOUX, Jean-Michel ...(IEEE Electron Device Letters. vol. 30, n° 3, pp. 222-224, 2009-02-25)Article de revue