BEN KHEMIS, Sabri; CAUMES, Jean-Pascal; PRADERE, Christophe

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Licencia de uso del documento

BEN KHEMIS, Sabri

CAUMES, Jean-Pascal

PRADERE, Christophe

Idioma

Brevet

Este ítem está publicado en

2014-06-27

Resumen en inglés

The subject of the present invention relates to an optical process for measuring a variation in the temperature of an abject (0), comprising: an emitting step (Sl) consisting in emitting, in the direction of said abject (0), a first incident terahertz elec - tromagnetic wave (Wl_inc), and a measuring step (S2) comprising measuring (S2_3), using a sensor sensitive to terahertz radiation (20), a variation in the amplitude of the electromagnetic radiation of a second electromagnetic wave (W2_ref, W2_tra) in order to determine the variation in the temperature of said abject (0).< Leer menos

URI

https://oskar-bordeaux.fr/handle/20.500.12278/77930

N° de patente

WO2014/096693

Orígen

Importado de Hal

Centros de investigación

Institut de Mécanique et d’Ingénierie de Bordeaux (I2M) - UMR 5295