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Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors
(30th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC 2022), 30th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC 2022), gr, Patras, 2022-11-08)Communication dans un congrès avec actes -
Circuit Design Flow dedicated to 3D vertical nanowire FET
(IEEE Latin American Electron Devices Conference (LAEDC 2022), IEEE Latin American Electron Devices Conference (LAEDC 2022), mx, Cancun, 2022-10-10)Communication dans un congrès avec actes -
A Zonotopic-Based Watermarking Design to Detect Replay Attacks
(IEEE/CAA Journal of Automatica Sinica. vol. 9, n° 11, pp. 1924-1938, 2022-11)Article de revueLibre accès -
Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA
(Microelectronics Reliability. vol. 138, pp. 114698, 2022-11-01)Article de revue -
Functional sets with typed symbols: Mixed zonotopes and Polynotopes for hybrid nonlinear reachability and filtering
(Automatica. vol. 143, pp. 110457, 2022-09-01)Article de revueLibre accès -
In vitro differentiation of human cardiac fibroblasts into myofibroblasts: characterization using electrical impedance
(Biomedical Physics & Engineering Express. vol. 8, n° 5, pp. 055007, 2022-07-07)Article de revue -
Integrated-Transformer-Based Impedance Matching Method: Impedance Matching With Transformers
(IEEE Microwave Magazine. vol. 23, n° 9, pp. 40-56, 2022-08-02)Article de revue -
A generic learning simulation framework to assess security strategies in cyber-physical production systems
(Computer Networks. vol. 218, pp. 109381, 2022-12-09)Article de revue -
Avancées technologiques des sources et capteurs térahertz - Vers le transfert industriel
(Les Techniques de l'Ingenieur. n° P2145 v1, 2022-02-10)Article de revue -
Self-Deformable Flexible MEMS Tweezer Composed of Poly(Vinylidene Fluoride)/Ionic Liquid Gel for Electrical Measurements and Soft Gripping
(Journal of Microelectromechanical Systems. vol. 31, n° 5, pp. 802-812, 2022-07-29)Article de revue