Moisture absorption and desorption in epoxy mould compounds: Characterization of Fickian and non-Fickian behaviours in complex packages
TOMAS, Ariane
Laboratoire de l'intégration, du matériau au système [IMS]
United Monolithic Semiconductors [UMS]
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Laboratoire de l'intégration, du matériau au système [IMS]
United Monolithic Semiconductors [UMS]
TOMAS, Ariane
Laboratoire de l'intégration, du matériau au système [IMS]
United Monolithic Semiconductors [UMS]
< Réduire
Laboratoire de l'intégration, du matériau au système [IMS]
United Monolithic Semiconductors [UMS]
Langue
EN
Communication dans un congrès
Ce document a été publié dans
Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023, ESREF 2023, 2023-10-02, TOULOUSE. 2023-11, vol. 150, p. 115088
Elsevier BV
Résumé
This works analyses the moisture absorption and desorption in three different mould compounds used in QFN packaging technology. Moisture diffusion during accelerated tests is replicated on different sample type: bulk ...Lire la suite >
This works analyses the moisture absorption and desorption in three different mould compounds used in QFN packaging technology. Moisture diffusion during accelerated tests is replicated on different sample type: bulk material, empty QFN strips and empty QFNs to examine the diffusion modes. The temperature-dependent diffusion parameters are characterised using the Dual stage model. The combination of a Fickian and a non-Fickian behaviour of this model fits perfectly the diffusion results in a bulk resin sample. However, the diffusion parameters in the case of the QFN strips and packages suggest a non-negligible diffusion along the interfaces. The desorption analyses in these QFN samples show residual moisture. We suspect the presence of residual moisture at the leadframe/moulding interfaces. The desorption at standard industrial temperatures highlights anomalies, suggesting a critical thermal aging phenomenon.< Réduire
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