Moisture absorption and desorption in epoxy mould compounds: Characterization of Fickian and non-Fickian behaviours in complex packages
dc.rights.license | open | en_US |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
hal.structure.identifier | United Monolithic Semiconductors [UMS] | |
dc.contributor.author | TOMAS, Ariane | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | FREMONT, Helene
IDREF: 127007571 | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
dc.contributor.author | MALBERT, Nathalie | |
hal.structure.identifier | United Monolithic Semiconductors [UMS] | |
dc.contributor.author | NEFFATI, Mehdy | |
hal.structure.identifier | United Monolithic Semiconductors [UMS] | |
dc.contributor.author | LAMBERT, Benoit | |
dc.contributor.editor | LABAT, Nathalie | |
dc.contributor.editor | NOLHIER, Nicolas | |
dc.date.accessioned | 2023-11-07T08:22:26Z | |
dc.date.available | 2023-11-07T08:22:26Z | |
dc.date.issued | 2023-11 | |
dc.date.conference | 2023-10-02 | |
dc.identifier.issn | 0026-2714 | en_US |
dc.identifier.uri | oai:crossref.org:10.1016/j.microrel.2023.115088 | |
dc.identifier.uri | https://oskar-bordeaux.fr/handle/20.500.12278/184651 | |
dc.description.abstract | This works analyses the moisture absorption and desorption in three different mould compounds used in QFN packaging technology. Moisture diffusion during accelerated tests is replicated on different sample type: bulk material, empty QFN strips and empty QFNs to examine the diffusion modes. The temperature-dependent diffusion parameters are characterised using the Dual stage model. The combination of a Fickian and a non-Fickian behaviour of this model fits perfectly the diffusion results in a bulk resin sample. However, the diffusion parameters in the case of the QFN strips and packages suggest a non-negligible diffusion along the interfaces. The desorption analyses in these QFN samples show residual moisture. We suspect the presence of residual moisture at the leadframe/moulding interfaces. The desorption at standard industrial temperatures highlights anomalies, suggesting a critical thermal aging phenomenon. | |
dc.language.iso | EN | en_US |
dc.publisher | Elsevier BV | en_US |
dc.source | crossref | |
dc.title.en | Moisture absorption and desorption in epoxy mould compounds: Characterization of Fickian and non-Fickian behaviours in complex packages | |
dc.type | Communication dans un congrès | en_US |
dc.identifier.doi | 10.1016/j.microrel.2023.115088 | en_US |
dc.subject.hal | Sciences de l'ingénieur [physics] | en_US |
bordeaux.page | 115088 | en_US |
bordeaux.volume | 150 | en_US |
bordeaux.hal.laboratories | IMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218 | en_US |
bordeaux.institution | Université de Bordeaux | en_US |
bordeaux.institution | Bordeaux INP | en_US |
bordeaux.institution | CNRS | en_US |
bordeaux.conference.title | ESREF 2023 | en_US |
bordeaux.country | fr | en_US |
bordeaux.title.proceeding | Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023 | en_US |
bordeaux.team | RELIABILITY-RIAD,WBG | en_US |
bordeaux.conference.city | TOULOUSE | en_US |
bordeaux.import.source | dissemin | |
hal.identifier | hal-04273061 | |
hal.version | 1 | |
hal.date.transferred | 2023-11-10T09:12:13Z | |
hal.invited | oui | en_US |
hal.proceedings | oui | en_US |
hal.conference.end | 2023-10-05 | |
hal.popular | non | en_US |
hal.audience | Internationale | en_US |
hal.export | true | |
workflow.import.source | dissemin | |
dc.rights.cc | Pas de Licence CC | en_US |
bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.date=2023-11&rft.volume=150&rft.spage=115088&rft.epage=115088&rft.eissn=0026-2714&rft.issn=0026-2714&rft.au=TOMAS,%20Ariane&FREMONT,%20Helene&MALBERT,%20Nathalie&NEFFATI,%20Mehdy&LAMBERT,%20Benoit&rft.genre=unknown |
Fichier(s) constituant ce document
Fichiers | Taille | Format | Vue |
---|---|---|---|
Il n'y a pas de fichiers associés à ce document. |