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dc.rights.licenseopenen_US
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
hal.structure.identifierUnited Monolithic Semiconductors [UMS]
dc.contributor.authorTOMAS, Ariane
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorFREMONT, Helene
IDREF: 127007571
hal.structure.identifierLaboratoire de l'intégration, du matériau au système [IMS]
dc.contributor.authorMALBERT, Nathalie
hal.structure.identifierUnited Monolithic Semiconductors [UMS]
dc.contributor.authorNEFFATI, Mehdy
hal.structure.identifierUnited Monolithic Semiconductors [UMS]
dc.contributor.authorLAMBERT, Benoit
dc.contributor.editorLABAT, Nathalie
dc.contributor.editorNOLHIER, Nicolas
dc.date.accessioned2023-11-07T08:22:26Z
dc.date.available2023-11-07T08:22:26Z
dc.date.issued2023-11
dc.date.conference2023-10-02
dc.identifier.issn0026-2714en_US
dc.identifier.urioai:crossref.org:10.1016/j.microrel.2023.115088
dc.identifier.urihttps://oskar-bordeaux.fr/handle/20.500.12278/184651
dc.description.abstractThis works analyses the moisture absorption and desorption in three different mould compounds used in QFN packaging technology. Moisture diffusion during accelerated tests is replicated on different sample type: bulk material, empty QFN strips and empty QFNs to examine the diffusion modes. The temperature-dependent diffusion parameters are characterised using the Dual stage model. The combination of a Fickian and a non-Fickian behaviour of this model fits perfectly the diffusion results in a bulk resin sample. However, the diffusion parameters in the case of the QFN strips and packages suggest a non-negligible diffusion along the interfaces. The desorption analyses in these QFN samples show residual moisture. We suspect the presence of residual moisture at the leadframe/moulding interfaces. The desorption at standard industrial temperatures highlights anomalies, suggesting a critical thermal aging phenomenon.
dc.language.isoENen_US
dc.publisherElsevier BVen_US
dc.sourcecrossref
dc.title.enMoisture absorption and desorption in epoxy mould compounds: Characterization of Fickian and non-Fickian behaviours in complex packages
dc.typeCommunication dans un congrèsen_US
dc.identifier.doi10.1016/j.microrel.2023.115088en_US
dc.subject.halSciences de l'ingénieur [physics]en_US
bordeaux.page115088en_US
bordeaux.volume150en_US
bordeaux.hal.laboratoriesIMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218en_US
bordeaux.institutionUniversité de Bordeauxen_US
bordeaux.institutionBordeaux INPen_US
bordeaux.institutionCNRSen_US
bordeaux.conference.titleESREF 2023en_US
bordeaux.countryfren_US
bordeaux.title.proceedingSpecial issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023en_US
bordeaux.teamRELIABILITY-RIAD,WBGen_US
bordeaux.conference.cityTOULOUSEen_US
bordeaux.import.sourcedissemin
hal.identifierhal-04273061
hal.version1
hal.date.transferred2023-11-10T09:12:13Z
hal.invitedouien_US
hal.proceedingsouien_US
hal.conference.end2023-10-05
hal.popularnonen_US
hal.audienceInternationaleen_US
hal.exporttrue
workflow.import.sourcedissemin
dc.rights.ccPas de Licence CCen_US
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