CHASSAIN, Clément; KUSIAK, Andrzej; KRAUSE, Kevin; GARCIA, Marine; BATTAGLIA, Jean-Luc

doi:10.1002/pssr.202200328

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CHASSAIN, Clément
Institut de Mécanique et d'Ingénierie [I2M]

KUSIAK, Andrzej
Institut de Mécanique et d'Ingénierie [I2M]

KRAUSE, Kevin
Institut de Mécanique et d'Ingénierie [I2M]

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Article de revue

Ce document a été publié dans

physica status solidi (RRL) – Rapid Research Letters. 2023-02-01, vol. n/a, n° n/a

Résumé en anglais

Pulsed periodic photothermal radiometry (PPTR) allows the investigation of multilayered samples with layer thicknesses of a few hundred nanometers over a duration of a few nanoseconds. The link between theoretical calculations and experimentation is made using a Bayesian approach based on the Metropolis–Hastings algorithm. The accuracy of the PPTR method requires precise calibration to provide an accurate proper emission measurement. Furthermore, the normalization time needs to be optimized through sensitivity analysis. Without this sensitivity analysis, it is impossible to simultaneously estimate the interfacial thermal resistances in a multilayered sample. The method is tested on multilayered samples composed of platinum (Pt), titanium nitride (TiN), silicon nitride (SiN), and silicon (Si). The parameters identified are interfacial thermal resistances between Pt–TiN and TiN–SiN.< Réduire

Mots clés en anglais

Interfacial thermal resistances

Inverse methods

Markov chain Monte Carlo

Multilayered

Nanoscales

Normalization methods

URI

https://oskar-bordeaux.fr/handle/20.500.12278/172375

DOI

http://dx.doi.org/10.1002/pssr.202200328

Projet Européen

European Union’s Horizon 2020 research and innovation programme

Unités de recherche

Institut de Mécanique et d’Ingénierie de Bordeaux (I2M) - UMR 5295