DURIER, Andre; BEN DHIA, Sonia; BOYER, Alexandre; DUBOIS, Tristan

doi:10.1109/EMCEurope51680.2022.9900974

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Communication dans un congrès avec actes

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International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, 2022-09-05, Goteborg. 2022-10-05

IEEE

Résumé en anglais

The increasing complexity of embedded calculators in terrestrial vehicles makes more and more complex their qualification for Electromagnetic Compatibility. The cost of test facilities and certified personnel for a normative test in Radiated Immunity (RI) is high and constitutes a bottleneck for Original Equipment Manufacturers (OEM). To solve their problem, OEM need a quick, economical and easy-to-use investigative system. The Near Field Scan Immunity (NFSI) method is quite fitted to be a good investigation tool when used with immunity probe dedicated to investigation at Printed Circuit Board (PCB) level. But, to be able to compare NFSI measurements to RI ones, problems inherent in NFSI measurement as its dependency to probe's position and the non-consideration of the harness resonances seen during the RI measurement must be solved. This paper presents a methodology to predict the RI immunity level of an equipment after layout or component change from a RI measurement performed on original equipment and NFSI measurement performed on both versions.< Réduire

Mots clés en anglais

Near field scan immunity probe

Radiated im-munity prediction from near field scan immunity measurements

Test facilities

Costs

Printed circuits

Layout

Europe

Immunity testing

Position measurement

URI

https://oskar-bordeaux.fr/handle/20.500.12278/172093

DOI

http://dx.doi.org/10.1109/EMCEurope51680.2022.9900974

Unités de recherche

IMS : Laboratoire de l'Intégration du Matériau au Système - UMR 5218

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A new Investigation Methodology to predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements

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Résumé en anglais

Mots clés en anglais

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Unités de recherche