A new Investigation Methodology to predict Far Field Radiated Immunity from Near Field Scan Immunity Measurements
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Communication dans un congrès avec actes
Este ítem está publicado en
International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, International Symposium and Exhibition on Electromagnetic Compatibility EMC Europe 2022, 2022-09-05, Goteborg. 2022-10-05
IEEE
Resumen en inglés
The increasing complexity of embedded calculators in terrestrial vehicles makes more and more complex their qualification for Electromagnetic Compatibility. The cost of test facilities and certified personnel for a normative ...Leer más >
The increasing complexity of embedded calculators in terrestrial vehicles makes more and more complex their qualification for Electromagnetic Compatibility. The cost of test facilities and certified personnel for a normative test in Radiated Immunity (RI) is high and constitutes a bottleneck for Original Equipment Manufacturers (OEM). To solve their problem, OEM need a quick, economical and easy-to-use investigative system. The Near Field Scan Immunity (NFSI) method is quite fitted to be a good investigation tool when used with immunity probe dedicated to investigation at Printed Circuit Board (PCB) level. But, to be able to compare NFSI measurements to RI ones, problems inherent in NFSI measurement as its dependency to probe's position and the non-consideration of the harness resonances seen during the RI measurement must be solved. This paper presents a methodology to predict the RI immunity level of an equipment after layout or component change from a RI measurement performed on original equipment and NFSI measurement performed on both versions.< Leer menos
Palabras clave en inglés
Near field scan immunity probe
Radiated im-munity prediction from near field scan immunity measurements
Test facilities
Costs
Printed circuits
Layout
Europe
Immunity testing
Position measurement
Centros de investigación