Specific approach of generalized ellipsometry for the determination of weak in-plane anisotropy: application to Langmuir-Blodgett ultrathin films
Language
en
Article de revue
This item was published in
Journal of the Optical Society of America. A, Optics and image science. 1998, vol. 15, n° 10, p. 2769-2782
Optical Society of America
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Hal imported