Laser probes for the thermal and thermomechanical characterisation of microelectronic devices
Langue
en
Article de revue
Ce document a été publié dans
Microelectronics Journal. 2001-10, vol. 32, n° 10-11, p. 891-898
Elsevier
Résumé en anglais
This paper presents a review of some of the recent works that we have done on thermal characterisation of running electronic devices by laser probing. Both the single point probing and the surface imaging methodologies are ...Lire la suite >