Laser probes for the thermal and thermomechanical characterisation of microelectronic devices
Idioma
en
Article de revue
Este ítem está publicado en
Microelectronics Journal. 2001-10, vol. 32, n° 10-11, p. 891-898
Elsevier
Resumen en inglés
This paper presents a review of some of the recent works that we have done on thermal characterisation of running electronic devices by laser probing. Both the single point probing and the surface imaging methodologies are ...Leer más >