Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions
Langue
en
Article de revue
Ce document a été publié dans
Applied Physics Letters. 2004-02-02, vol. 84, n° 5, p. 822-824
American Institute of Physics
Résumé en anglais
We show that, in thermoreflectance measurements under high focusing conditions, the signal is not only due to the surface temperature variations. Indeed, the reflected light from the device under test interferes with the ...Lire la suite >
We show that, in thermoreflectance measurements under high focusing conditions, the signal is not only due to the surface temperature variations. Indeed, the reflected light from the device under test interferes with the incoming one, making a parasitic Fabry-Pérot. Besides, the motion of the sample surface induced, for example, by Joule heating, can produce an additional signal superimposed on the thermoreflectance one. Consequently, reliable thermoreflectance measurements under high focusing conditions, and particularly their calibration, demand a control of the distance between the objective and the sample. Using a servo loop to maintain the distance between the objective and the device constant, thermoreflectance measurements have been made in transient regime on an electronic device and the thermoreflectance coefficient of gold has been deduced.< Réduire
Mots clés en anglais
Optical metrology
Electronic devices
Transition metals
Thermodynamic states and processes
Origine
Importé de halUnités de recherche