Influence of a rough thin layer on the steady-state potential
PERRUSSEL, Ronan
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
PERRUSSEL, Ronan
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
< Reduce
Institut Camille Jordan [ICJ]
Centre de génie électrique de Lyon [CEGELY]
Ampère [AMPERE]
Language
en
Rapport
This item was published in
2009p. 11
English Abstract
In this paper, we study the behavior of the steady-state voltage potentials in a material composed by an interior medium surrounded by a rough thin layer and embedded in an ambient bounded medium. The roughness of the layer ...Read more >
In this paper, we study the behavior of the steady-state voltage potentials in a material composed by an interior medium surrounded by a rough thin layer and embedded in an ambient bounded medium. The roughness of the layer is supposed to be $\eps$--periodic, $\eps$ being the small thickness of the layer. We present and validate numerically the rigorous approximate transmissions proved by Ciuperca, Jai and Poignard. This paper extends previous works in which the layer had a constant thickness.Read less <
English Keywords
Asymptotic analysis
Finite Element Method
Laplace equations
Origin
Hal imported