Imaging Thermoelectric Properties at the Nanoscale
Language
en
Article de revue
This item was published in
Nanomaterials. 2021-05-01, vol. 11, n° 5, p. 1199
MDPI
English Abstract
Based on our previous experimental AFM set-up specially designed for thermal conductivity measurements at the nanoscale, we have developed and validated a prototype which offers two major advantages. On the one hand, we ...Read more >
Based on our previous experimental AFM set-up specially designed for thermal conductivity measurements at the nanoscale, we have developed and validated a prototype which offers two major advantages. On the one hand, we can simultaneously detect various voltages, providing, at the same time, both thermal and electrical properties (thermal conductivity, electrical conductivity and Seebeck coefficient). On the other hand, the AFM approach enables sufficient spatial resolution to produce images of nanostructures such as nanowires (NWs). After a software and hardware validation, we show the consistency of the signals measured on a gold layer on a silicon substrate. Finally, we demonstrate that the imaging of Ge NWs can be achieved with the possibility to extract physical properties such as electrical conductivity and Seebeck coefficient, paving the way to a quantitative estimation of the figure of merit of nanostructures.Read less <
English Keywords
Nanowire
Thermal conductivity
Electrical conductivity
Imaging
ANR Project
Propriétés de la phase hexagonale 2H du Ge et Si - ANR-17-CE30-0014
Origin
Hal imported