Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact
BUCHAILLOT, Lionel
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
< Reduce
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Language
en
Article de revue
This item was published in
Nanotechnology. 2009-10-26, vol. 20, n° 47, p. 475701 (1-8)
Institute of Physics
English Abstract
Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical ...Read more >
Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical atomic force microscope modes. Experimental results show that the carbon nanotube contacts can be classified in two categories: the free sliding and pinned cases. The pinned contact case requires the description of the cantilever flexural vibrations with support spring-coupled cantilever boundary conditions. Our experimental results show that carbon nanotubes exhibit different contact behaviors with a surface, and in turn different mechanical responses.Read less <
Origin
Hal imported