Terahertz and far-infrared response of BaxSr1-xTiO3 films
Language
en
Communication dans un congrès
This item was published in
2010-05-24, Telč. 2011-11-20, vol. 83, n° 10-11, p. 966-973
English Abstract
Here, we report on the experimental study of terahertz (THz) and far-infrared dielectric response of polycrystalline BaxSr1-xTiO3 (x = 0.5, 0.7, and 0.8) films of 0.3-1 mu m thicknesses deposited on a sapphire. THz and ...Read more >
Here, we report on the experimental study of terahertz (THz) and far-infrared dielectric response of polycrystalline BaxSr1-xTiO3 (x = 0.5, 0.7, and 0.8) films of 0.3-1 mu m thicknesses deposited on a sapphire. THz and far-infrared transmission measurements were performed in 100-420 K temperature range covering the vicinity of TC of their bulk prototypes. We identified all polar optical phonons observed in bulk samples below 400 cm-1 of the same composition including soft and central modes and found some additional features, which we assigned to the depolarizing field effect coming from the structural inhomogeneity and unreleased strain.Read less <
Origin
Hal imported