SCHAAB, Jakob; KRUG, Ingo P.; NICKEL, F.; GOTTLOB, Daniel M.; DOĞANAY, Hatice; CANO, Andres; HENTSCHEL, Mario; YAN, Z.; BOURRET-COURCHESNE, Edith; SCHNEIDER, Claus Michael; RAMESH, Ramamoorthy; MEIER, Dennis

doi:10.1063/1.4879260

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SCHAAB, Jakob
Department of Materials

KRUG, Ingo P.
Institut für Optik und Atomare Physik
Forschungszentrum Jülich Peter Grünberg Institute [PGI-6]

NICKEL, F.
Forschungszentrum Jülich Peter Grünberg Institute [PGI-6]

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Applied Physics Letters. 2014, vol. 104, n° 23, p. 232904 (4 p.)

American Institute of Physics

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High-resolution X-ray photoemission electron microscopy (X-PEEM) is a well-established method for imaging ferroelectric domain structures. Here, we expand the scope of application of X-PEEM and demonstrate its capability for imaging and investigating domain walls in ferroelectrics with high-spatial resolution. Using ErMnO3 as test system, we show that ferroelectric domain walls can be visualized based on photo-induced charging effects and local variations in their electronic conductance can be mapped by analyzing the energy distribution of photoelectrons. Our results open the door for non-destructive, contract-free, and element-specific studies of the electronic and chemical structure at domain walls in ferroelectrics.< Réduire

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Imaging and characterization of conducting ferroelectric domain walls by photoemission electron microscopy

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