Study of ceramic materials in the SrSnO<sub>3</sub>–NaNbO<sub>3</sub> system by X-ray diffraction, dielectric and Raman spectroscopy
Language
en
Article de revue
This item was published in
Journal of Alloys and Compounds. 2009, vol. 484, n° 1-2, p. 356-359
Elsevier
English Abstract
Ceramics with composition belonging to the SrSnO<sub>3</sub>–NaNbO<sub>3</sub> system were sintered in the temperature range 1100–1350 °C. The symmetry, dielectric properties and Raman spectroscopy were investigated. X-ray ...Read more >
Ceramics with composition belonging to the SrSnO<sub>3</sub>–NaNbO<sub>3</sub> system were sintered in the temperature range 1100–1350 °C. The symmetry, dielectric properties and Raman spectroscopy were investigated. X-ray diffraction results demonstrate that a region with the cubic or tetragonal phases lies in the composition range <i>x</i> < 0.89 and <i>x</i> ≥ 0.89, respectively.Read less <
English Keywords
Ceramic
Dielectric
Ferroelectric
Relaxor
Raman and X-ray diffraction
Origin
Hal imported