Experimental measurements of Xe and Kr releases from UO2 and determination of their migration mechanisms – Release rate data
Language
en
Article de revue
This item was published in
Data in Brief. 2021, vol. 39, p. 107645
Elsevier
English Abstract
We present the raw data obtained from release rate at 1300°C of Xe and Kr implanted in UO2, related to [1]. We performed different sample preparation (polishing treatment) on polycrystalline and monocrystalline UO2. Ion ...Read more >
We present the raw data obtained from release rate at 1300°C of Xe and Kr implanted in UO2, related to [1]. We performed different sample preparation (polishing treatment) on polycrystalline and monocrystalline UO2. Ion implantation were performed at various fluences between 9.5 × 1010 to 5 × 1014 i/cm2 in UO2 samples. Release rate of Xe and Kr are obtained at 1300°C under vacuum from desorption experiments performed on the PIAGARA plateform at the CENBG (Centre d'Etudes Nucléaires de Bordeaux-Gradignan). Since we made a variety of samples depending on multiple parameters (sample type, sample preparation, ion implantation type and fluence), these data represent a serious amount of work that could be saved for the scientific community that might use them for other purposes such as burst modelling.Read less <
Origin
Hal imported