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Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer
(Microelectronics Reliability. vol. 38, n° 10, pp. 1591-1597, 1998-10)Article de revue -
Sondes laser et méthodologies pour l'analyse thermique à l'échelle micrométrique. Application à la microélectronique
(Revue Générale de Thermique. vol. 37, n° 1, pp. 49-59, 1998-01)Article de revue -
BiCMOS thermal sensor circuit for built-in test purposes
(Electronics Letters. vol. 34, n° 13, pp. 1307-1309, 1998-01-25)Article de revue -
Modelling and experimental study of heat deposition and transport in a semiconductor laser diode
(Microelectronics Reliability. vol. 29, n° 4-5, pp. 171-179, 1998-04)Article de revue -
Thermoreflectance measurements of transient temperature upon integrated circuits: application to thermal conductivity identification
(Microelectronics Reliability. vol. 29, n° 4-5, pp. 181-190, 1998-04)Article de revue