Recherche
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Quantitative thermoreflectance imaging : calibration method and validation on a dedicated integrated circuit
Communication dans un congrès -
Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers
(Superlattices and Microstructures. vol. 38, n° 1, pp. 69-75, 2005-07-06)Article de revue -
Experimental determination of conservative and dissipative parts in the tapping mode on a grafted layer: comparison with frequency modulation data
(Nanotechnology. vol. 16, n° 6, pp. 901-907, 2005)Article de revue -
Mechanical properties of a carbon nanotube fixed at a tip apex: A frequency-modulated atomic force microscopy study
(Physical Review B: Condensed Matter and Materials Physics (1998-2015). vol. 72, n° 3, pp. 16, 2005)Article de revue -
Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis
(IEEE Electron Device Letters. vol. 26, n° 7, pp. 461-463, 2005-07)Article de revue -
Optical detection and characterisation of an isolated metallic isoparticle
Communication dans un congrès -
Optical spectroscopy of metal nanoparticles: single particle detection
Communication dans un congrès -
Periodic ripples produced by a scanning beam of a femtosecond Ti : sapphire laser
(Advanced Laser Technologies 2004. vol. 5850, pp. 82-87, 2005)Article de revue -
Magnetic orbitals and mechanisms of exchange II. Superexchange
(Chemical Monthly = Monatshefte für Chemie. vol. 136, n° 6, pp. 1013-1036, 2005)Article de revue -
Study of thermomechanical properties of Si/SiGe superlattices using femtosecond transient thermoreflectance technique
(Applied Physics Letters. vol. 87, n° 10, pp. 103506 (1-3), 2005-09-05)Article de revue