Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis
Langue
en
Article de revue
Ce document a été publié dans
IEEE Electron Device Letters. 2005-07, vol. 26, n° 7, p. 461-463
Institute of Electrical and Electronics Engineers
Résumé en anglais
In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier ...Lire la suite >
In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage.< Réduire
Mots clés en anglais
Electric variables measurement
Thermoreflectance
Calibration
Diode lasers
Temperature sensors
Optical sensors
Optical design
Optical control
Temperature control
Testing
Origine
Importé de halUnités de recherche