Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | DILHAIRE, S. | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | GRAUBY, Stéphane | |
| hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
| dc.contributor.author | CLAEYS, W. | |
| dc.date.issued | 2005-07 | |
| dc.identifier.issn | 0741-3106 | |
| dc.description.abstractEn | In this letter, we present a thermoreflectance setup specially designed for the study of the temperature variations of the output facet of a laser diode. Indeed, the temperature of the laser diode is controlled by a Peltier element and the device under test is used as a temperature sensor. We propose a calibration procedure based on electrical measurements combined with optical ones; it leads to the determination of thermoreflectance coefficients and then to absolute temperature variations on a running laser diode. We can hence ensure a proper running of the diode and avoid its catastrophic optical facet damage. | |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers | |
| dc.subject.en | Electric variables measurement | |
| dc.subject.en | Thermoreflectance | |
| dc.subject.en | Calibration | |
| dc.subject.en | Diode lasers | |
| dc.subject.en | Temperature sensors | |
| dc.subject.en | Optical sensors | |
| dc.subject.en | Optical design | |
| dc.subject.en | Optical control | |
| dc.subject.en | Temperature control | |
| dc.subject.en | Testing | |
| dc.title.en | Thermoreflectance calibration procedure on a laser diode: Application to catastrophic optical facet damage analysis | |
| dc.type | Article de revue | |
| dc.identifier.doi | 10.1109/led.2005.851090 | |
| dc.subject.hal | Physique [physics] | |
| bordeaux.journal | IEEE Electron Device Letters | |
| bordeaux.page | 461-463 | |
| bordeaux.volume | 26 | |
| bordeaux.issue | 7 | |
| bordeaux.peerReviewed | oui | |
| hal.identifier | hal-01552734 | |
| hal.version | 1 | |
| hal.popular | non | |
| hal.audience | Internationale | |
| hal.origin.link | https://hal.archives-ouvertes.fr//hal-01552734v1 | |
| bordeaux.COinS | ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=IEEE%20Electron%20Device%20Letters&rft.date=2005-07&rft.volume=26&rft.issue=7&rft.spage=461-463&rft.epage=461-463&rft.eissn=0741-3106&rft.issn=0741-3106&rft.au=DILHAIRE,%20S.&GRAUBY,%20St%C3%A9phane&CLAEYS,%20W.&rft.genre=article |
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