Recherche
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Waveform design to improve the estimation of target parameters using the Fourier Transform method in a MIMO OFDM DFRC system
(ICASSP, gr, Iles de Rhodes, 2023-06-10)Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Sharing Our Positive Experience About the ASSETs+ European Defence Challenge
(EDUCON, kw, Kuweit city, 2023)Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors
(30th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC 2022), 30th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SOC 2022), gr, Patras, 2022-11-08)Communication dans un congrès avec actes -
Circuit Design Flow dedicated to 3D vertical nanowire FET
(IEEE Latin American Electron Devices Conference (LAEDC 2022), IEEE Latin American Electron Devices Conference (LAEDC 2022), mx, Cancun, 2022-10-10)Communication dans un congrès avec actes -
A Highly Compact 1W Ku-Band Power Amplifier
(2022 IEEE 13th Latin America Symposium on Circuits and System (LASCAS), 2022 IEEE 13th Latin America Symposium on Circuits and System (LASCAS), cl, Puerto Varas, 2022-06-08)Communication dans un congrès avec actes -
Modeling hydrolysis kinetics of dual phase α-Mg/LPSO alloys
(International Journal of Hydrogen Energy, 2022-06)Article de revue -
Optimal Trajectory Planning and Robust Tracking Using Vehicle Model Inversion
(IEEE Transactions on Intelligent Transportation Systems. vol. 23, n° 5, pp. 1-14, 2022-05)Article de revue -
A matrix approach to get the variance of the square of the fluctuation function of the DFA
(Digital Signal Processing. vol. 122, 2022-04-15)Article de revue -
Experimental and theoretical approach of the hydrolysis of pelleted magnesium alloys scraps
(Journal of Alloys and Compounds. vol. 919, pp. 165784, 2022)Article de revue -
Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA
(Microelectronics Reliability. vol. 138, pp. 114698, 2022-11-01)Article de revue