Characterization of lithium phosphorus oxide thin film libraries by Laser-Induced Breakdown Spectroscopy imaging: A step towards high-throughput quantitative analyses
BERTHOU, William
CEA Tech Nouvelle-Aquitaine [DNAQ]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
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CEA Tech Nouvelle-Aquitaine [DNAQ]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
BERTHOU, William
CEA Tech Nouvelle-Aquitaine [DNAQ]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
CEA Tech Nouvelle-Aquitaine [DNAQ]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
LE CRAS, Frédéric
Département de l'électricité et de l'hydrogène pour les transports [DEHT]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
< Réduire
Département de l'électricité et de l'hydrogène pour les transports [DEHT]
Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB]
Langue
en
Article de revue
Ce document a été publié dans
Spectrochimica Acta Part B: Atomic Spectroscopy. 2024, vol. 215, p. 106906
Elsevier
Résumé en anglais
Elemental analysis is a challenge for the development of High Throughput Experimentation (HTE) on thin film materials, and an even greater one when it comes to screening lithium-containing battery materials. In this regard, ...Lire la suite >
Elemental analysis is a challenge for the development of High Throughput Experimentation (HTE) on thin film materials, and an even greater one when it comes to screening lithium-containing battery materials. In this regard, Laser-Induced Breakdown Spectroscopy has been evaluated here for the quantitative analysis of lithium in libraries of Li2.3PO3.65 amorphous solid electrolyte films. The LIBS analysis of multiple samples with the same composition, but with thicknesses ranging from 50 to 700 nm, has revealed a linear trend in the intensity ratio of the Li I 610.35 nm and P I 214.91 nm emission lines, opening the way to rapid quantitative analysis of material libraries. The sensitivity of the technique finally allowed the detection of the Li I 670.79 nm emission line for film thicknesses down to 4 nm, corresponding to 0.2% of the ablated volume, or about 0.15 pg of Li< Réduire
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