ALTET, J.; ALDRETE-VIDRIO, E.; REVERTER, F.; GOMEZ, D.; GONZALEZ, J.L.; ONABAJO, M.; SILVA-MARTINEZ, J.; MARTINEAU, B.; PERPINÀ, X.; ABDALLAH, L.; STRATIGOPOULOS, Haralampos-G; ARAGONÈS, X.; JORDÀ, X.; VELLVEHI, M.; DILHAIRE, S.; MIR, Salvador; MATEO, D.

doi:10.1109/MWSCAS.2014.6908606

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ALTET, J.
Electronic Engineering Department

ALDRETE-VIDRIO, E.
Electronic Engineering Department

REVERTER, F.
Electronic Engineering Department

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57th IEEE Midwest Symposium on Circuits and Systems (MWSCAS'14), 2014-08-03, Texas. 2014p. 1081-1084

IEEE Computer Society

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This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The strategy is to embed small temperature sensors on the same silicon die as the circuit under test, taking advantage of empty spaces in the layout. This paper reviews the physical principles, and presents examples that reveal how temperature sensors can be used as functional built-in testers serving to reduce testing costs and enhance yield as part of self-healing strategies.< Réduire

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built in testing

temperature sensors

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Review of temperature sensors as monitors for RF mmW built-in testing and self-calibration schemes

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