Ultrafast amplifier additive timing jitter characterization and control
CASANOVA, Alexis
Amplitude Systèmes
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
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Amplitude Systèmes
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
CASANOVA, Alexis
Amplitude Systèmes
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
< Leer menos
Amplitude Systèmes
Laboratoire Photonique, Numérique et Nanosciences [LP2N]
Laboratoire Ondes et Matière d'Aquitaine [LOMA]
Idioma
en
Article de revue
Este ítem está publicado en
Optics Letters. 2016-03-01, vol. 41, n° 5, p. 898-900
Optical Society of America - OSA Publishing
Resumen en inglés
We report on the characterization and long-term compensation of additive timing jitter introduced by a femtosecond ytterbium regenerative amplifier with a 100 kHz repetition rate. A balanced optical cross-correlation ...Leer más >
We report on the characterization and long-term compensation of additive timing jitter introduced by a femtosecond ytterbium regenerative amplifier with a 100 kHz repetition rate. A balanced optical cross-correlation technique is used to generate a jitter error signal. This approach is well suited to characterize the additive timing jitter of Yb amplifiers seeded by narrow spectrum Yb oscillators. The balanced optical cross-correlator is in a noncollinear configuration allowing a background free coindence detection. This setup enables the measurement of additive timing jitter from the amplifier, with a noise floor of 300 as integrated from 10 Hz to 10 kHz. The measured additive timing jitter level is about 5 fs, integrated from 0.1 Hz to 10 kHz. The amplifier timing drift characterization and control are performed for more than an hour.< Leer menos
Palabras clave en inglés
Lasers and laser optics
Instrumentation and measurement and metrology
Ultrafast optics
Proyecto ANR
PHENOMENES ET METROLOGIE TERMIQUES FEMTOSECONDES - ANR-10-NANO-0014
Orígen
Importado de HalCentros de investigación