Electrical characterization of Ca1-xErxF2+x luminescent thin films
dc.contributor.author | HIRSCH, L. | |
hal.structure.identifier | Laboratoire de l'intégration, du matériau au système [IMS] | |
hal.structure.identifier | Laboratoire d'études de l'intégration des composants et systèmes électroniques [IXL] | |
dc.contributor.author | BARRIÉRE, A. S. | |
hal.structure.identifier | Centre de physique moléculaire optique et hertzienne [CPMOH] | |
dc.contributor.author | SALARDENNE, J. | |
hal.structure.identifier | Institut de Chimie de la Matière Condensée de Bordeaux [ICMCB] | |
dc.contributor.author | REAU, J. M. | |
dc.date.issued | 1998 | |
dc.identifier.issn | 0021-8979 | |
dc.description.abstractEn | no abstract | |
dc.language.iso | en | |
dc.publisher | American Institute of Physics | |
dc.title.en | Electrical characterization of Ca1-xErxF2+x luminescent thin films | |
dc.type | Article de revue | |
dc.subject.hal | Physique [physics] | |
bordeaux.journal | Journal of Applied Physics | |
bordeaux.page | 7813-7821 | |
bordeaux.volume | 83 | |
bordeaux.issue | 12 | |
bordeaux.peerReviewed | oui | |
hal.identifier | hal-01550232 | |
hal.version | 1 | |
hal.popular | non | |
hal.audience | Internationale | |
hal.origin.link | https://hal.archives-ouvertes.fr//hal-01550232v1 | |
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